Analytical instruments

We use several analytical instruments on chemical analyses of metals and inorganic materials. 

Instrument: Inductively coupled plasma optical emission spectrometer
Model (with period of analysis): ARCOS FHM22 MV130 (2016–)
Manufacturer: SPECTRO Analytical Instruments GmbH, Kleve, Germany
Specifications: 130–770 nm wavelength range, Paschen-Runge mounting
Method: Inductively coupled plasma atomic emission spectrometry, ICP-AES

Our latest works using this spectrometer
K. Nakayama, ISIJ Int., 62 (2022) 1023.  doi: 10.2355/isijinternational.ISIJINT-2021-391
K. Nakayama and K. Wagatsuma, ISIJ Int., 61 (2021) 2181.  doi: 10.2355/isijinternational.ISIJINT-2020-716
K. Nakayama and K. Wagatsuma, ISIJ Int., 60 (2020) 193.  doi: 10.2355/isijinternational.ISIJINT-2019-393 

Instrument: Inductively coupled plasma optical emission spectrometer
Model (with period of analysis): IRIS Advantage DUO (2001–)
Manufacturer: Thermo Fisher Scientific Inc., Waltham, MA, United States
 (Original manufacturer: Thermo Jarrell Ash Corp., Franklin, MA, United States)
Specifications: echelle grating, charge injection device (CID) detector
Method: Inductively coupled plasma atomic emission spectrometry, ICP-AES

Our latest works using this spectrometer
K. Nakayama and K. Wagatsuma, ISIJ Int., 56 (2016) 1114.  doi: 10.2355/isijinternational.ISIJINT-2015-648
F. Sakamoto et al., Bunseki Kagaku, 64 (2015) 689.  doi: 10.2116/bunsekikagaku.64.689
T. Itagaki et al., Bunseki Kagaku, 59 (2010) 43.  doi: 10.2116/bunsekikagaku.59.43 

Instrument: Inductively coupled plasma mass spectrometer
Model (with period of analysis): iCAP TQ (2021–)
Manufacturer: Thermo Fisher Scientific Inc., Waltham, MA, United States
Specifications: Triple Quadropole, collision/reaction cell (helium, oxygen, and hydrogen)
Method: Inductively coupled plasma mass spectrometry, ICP-MS

Instrument: Atomic absorption spectrometer
Model (with period of analysis): contrAA 700 (2010–2021) / contrAA 800D (2022–)
Manufacturer: Analytik Jena GmbH, Jena, Germany
Specifications: continuum source of radiation by xenon short-arc lamp, echelle grating
Method: Flame atomic absorption spectrometry, FAAS
                graphite furnace atomic absorption spectrometry, GF-AAS

Our latest works using these spectrometers
K. Nakayama, ISIJ Int., 62 (2022) 849.  doi: 10.2355/isijinternational.ISIJINT-2021-360
K. Nakayama and K. Wagatsuma, ISIJ Int., 61 (2021) 2122.  doi: 10.2355/isijinternational.ISIJINT-2020-732
T. Itagaki et al., Bunseki Kagaku, 66 (2017) 515.  doi: 10.2116/bunsekikagaku.66.515

Instrument: Microwave plasma optical emission spectrometer
Model (with period of analysis): 4210 MP-AES (2022–)
Manufacturer: Agilent Technologies, Inc., Santa Clara, CA, United States
Specifications: nitrogen plasma, sequential scanning
Method: Microwave plasma atomic emission spectrometry, MP-AES

Instrument: Elemental analyzer for carbon and sulfur
Model (with period of analysis): CS-444 LS (1996–2018; disposal) / CS844 (2019–)
Manufacturer: LECO Corp., Saint Joseph, MI, United States
Specification: for inorganic materials
Method: Infrared absorption method after combustion

Instrument: Elemental analyzer for oxygen and nitrogen
Model (with period of analysis): TC-436 (1996–2018) / ON836 (2019–)
Manufacturer: LECO Corp., Saint Joseph, MI, United States
Specification: for inorganic materials
Method for oxygen: Infrared absorption method after fusion under He gas
Method for nitrogen: Thermal conductimetric method after fusion in a current of He gas

Our latest works using these analyzers
T. Chiba et al., Tetsu-to-Hagane, 104 (2018) 61.  doi: 10.2355/tetsutohagane.TETSU-2017-056
H. Shimada et al., Bunseki Kagaku, 63 (2014) 939.  doi: 10.2116/bunsekikagaku.63.939

Instrument: Elemental analyzer for hydrogen
Model (with period of analysis): EMGA-621 (1990–2017; disposal) / EMGA-821 (2018–)
Manufacturer: HORIBA, Ltd., Kyoto, Japan
Specification: for inorganic materials
Method: Thermal conductimetric method after fusion in a current of Ar gas

Instrument: Spectrophotometer
Model (with period of analysis): U-2910 (2007–)
Manufacturer: Hitachi, Ltd., Tokyo, Japan
Specification: 190–1100 nm wavelength range
Method: Spectrophotometry

Instrument: Ion chromatograph
Model (with period of analysis): 850 Professional IC (2011–)
Manufacturer: Metrohm AG, Herisau, Switzerland
Specifications: suppressed conductively detection for anion analysis,
non-suppressed conductively detection for cation analysis
Method: Ion chromatography

Instrument: X-ray fluorescence spectrometer
Model (with period of analysis): ZSX Primus II (2007–)
Manufacturer: Rigaku Corp., Tokyo, Japan
Specifications: 4 kW rhodium X-ray tube, ₉F – ₉₂U, vaccum atmosphere
Method: Wavelength dispersive X-ray fluorescence spectrometry, WDXRF

Our latest works using this spectrometer
K. Nakayama and K. Wagatsuma, X-Ray Spectrom., 49 (2020) 332.  doi: 10.1002/xrs.3134
K. Nakayama and K. Wagatsuma, ISIJ Int., 56 (2016) 2330.  doi: 10.2355/isijinternational.ISIJINT-2016-435
K. Nakayama and K. Wagatsuma, Anal. Sci., 31 (2015) 851.  doi: 10.2116/analsci.31.851